KPFM

Kelvin Probe Force Microscopy

We used single-pass Kelvin Probe Force Microscopy to study nanoscale electrical properties of surface. Examples include charge transfer between nanoparticles and substrate, electrical response of dielectric breakdown of polymers and electron double layer structure near graphene-electrolyte interface, oxide film-electrolyte interface. Examples can be found below:

Monica, Luna; Barawi, Mariam; Gómez-Moñivas, Sacha; Colchero, Jaima; Rodríguez-Peña, Micaela; Yang, Shanshan; Zhao, Xiao; Lu, Yi-Hsien; Chintala, Ravi; Reñones, Patricia; Altoe, Virginia; Martínez, Lidia; Huttel, Yves; Kawasaki, Seiji; Weber-Bargioni, Alexander; de la Peña ÓShea, Victor; Yang, Peidong; Ashby, Paul; Salmeron Miquel. "Photoinduced Charge Transfer and Trapping on Single Gold Metal Nanoparticles on TiO2." ACS Applied Materials & Interfaces, 2021. https://doi.org/10.1021/acsami.1c13662.