Atomic scale imaging, manipulation, and spectroscopy Mechanical and electrical properties of molecules in self-assembled films Ambient pressure photoelectron spectroscopy for environnemental sciences Studies of friction, adhesion, and wear at the nanometer scale Electronic, mechanical, and chemical properties of nanoclusters Structure of thin liquid films and wetting Nanoscale material imaging and manipulation (Molecular Foundry) Catalytic and chemical properties of surfaces
Updated by Franck, October 16 2007
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140. Scanning tunneling microscopy studies of Si donors (SiGa) in GaAs
J.F. Zheng, X. Liu, N. Newman, E.R. Weber, D.F. Ogletree and M. Salmeron.
Phys. Rev. Lett. 72, (10) 1490 (1994). LBNL-34499
141. Reversible displacement of chemisorbed n-alkane thiol molecules on Au(111) surface: An atomic
force microscopy study
G.-y. Liu and M. B. Salmeron.
Langmuir. 10, (2), 367 (1994). LBNL-34366
142. Nano-scale imaging of corrosion: Application of scanning polarization force microscopy
Q. Dai, J. Hu, A. Freedman, G.N. Robinson and M. Salmeron.
Proc. Diagnostic Techniques for Semiconductor Materials Processing II, Boston, Massachusetts,
November 27-30, 1995.
Diagnostic Techniques for Semiconductor Materials Processing II, eds. S.W. Pang, O.J.
Glembocki, F.H. Pollak, F.G. Celii and C.M. Sotomayor Torres. MRS Symposium Proceedings, vol.
406, pp. 215-220. Materials Research Society, Pittburgh, 1996.
143. Deposition of Au on a sulfur covered Mo(100) surface: Adsorbate-adsorbate interaction and
growth
J.C. Dunphy, C. Chapelier, D.F. Ogletree and M.B. Salmeron.
Proc. Intl. Conf. Scanning Tunneling Microscopy, Beijing, China, August 9-14, 1993.
J. Vac. Sci. Technol. B. 12, (3) 1742 (1994). LBNL-34501
144. Approach to surface structure determination with the scanning tunneling microscope: Multiplegap
imaging and electron-scattering quantum chemistry theory
J.C. Dunphy, P. Sautet, D.F. Ogletree and M.B. Salmeron.
Phys. Rev. B. 52, (15) 11446 (1995). LBNL-34502
145. Scanning tunneling microscopy tip-dependent image contrast of S/Pt(111) by controlled atom
transfer
B.J. McIntyre, P. Sautet, J.C. Dunphy, M. Salmeron and G.A. Somorjai.
Proc. Intl. Conf. Scanning Tunneling Microscopy, Beijing, China, August 9-14, 1993.
J. Vac. Sci. Technol. B. 12, (3) 1751 (1994). LBNL-34503
146. An in situ STM determination of a kinetic pathway for the coadsorbate-induced compression of
sulfur by CO on Pt(111)
B.J. McIntyre, M. Salmeron and G.A. Somorjai.
Surf. Sci. 323, (3) 189 (1995). LBNL-34504
147. Diffraction and holography with photoelectrons and fluorescent X-rays (review paper)
C.S. Fadley, Y. Chen, R.E. Couch, H. Daimon, R. Denecke, J.D. Denlinger, H. Galloway,
Z. Hussain, A.P. Kaduwela, Y.J. Kim, P.M. Len, J. Liesegang, J. Menchero, J. Morais,
J. Palomares, S.D. Ruebush, E. Rotenberg, M. Salmeron, R. Scalettar, W. Schattke, R. Singh,
S. Thevuthasan, E.D. Tober, M.A. Van Hove, Z. Wang and R.X. Ynzunza.
Proc. 7th Symp. on Surface Physics, Trešt, Czech Republic, June 30-July 4, 1996.
Prog. Surf. Sci. 54, (3-4) 341 (1997). LBNL-40117
148. Surface, interface and nanostructure characterization with photoelectron diffraction and
photoelectron and X-ray holography (review paper)
C.S. Fadley, Y. Chen, R.E. Couch, H. Daimon, R. Denecke, H. Galloway, Z. Hussain,
A.P. Kaduwela, Y.J. Kim, P.M. Len, J. Liesegang, J. Menchero, J. Morais, J. Palomares,
S.D. Ruebush, S. Ryce, M. Salmeron, W. Schattke, S. Thevuthasan, E.D. Tober, M.A. Van Hove, Z.
Wang, R.X. Ynzunza and J.J. Zaninovich.
Proc. 2nd Intl. Symposium on Advanced Physical Fields, Tsukuba, Japan, February 19-21, 1997.
J. Surf. Anal. 3, (2) 334 (1997). LBNL-40068
149. Imaging a p(2x2) layer of sulfur on Re(0001) with the STM: An experimental and theoretical
study of the effect of adsorption site and tip structure
P. Sautet, J.C. Dunphy, D.F. Ogletree, C. Joachim and M.B. Salmeron.
Surf. Sci. 315, 127 (1994). LBNL-34521
150. Ultrafast scanning probe microscopy
S. Weiss, D.F. Ogletree, D. Botkin, M. Salmeron and D.S. Chemla.
Appl. Phys. Lett. 63, (18) 2567 (1993). LBNL-34347
151. Scanning tunneling microscopy of Si donors in GaAs
J.F. Zheng, X. Liu, N. Newman, E.R. Weber, D.F. Ogletree and M.B. Salmeron.
Proc. 17th International Conference on Defects in Semiconductors (ICDS), Gmunden, Austria, July
18-23, 1993. Defects in Semiconductors 17, eds. H. Heinrich and W. Jantsch. Materials
Science Forum 143-147, p. 1319. Trans Tech Publications, Switzerland (1994). LBNL-34499
152. Growth of FeOx on Pt(111) studied by scanning tunneling microscopy
H.C. Galloway, J.J. Benitez and M. Salmeron.
Proc. 40th AVS Natl. Symposium, Orlando, Florida, November 15-19, 1993.
J. Vac. Sci. Technol. A. 12, (4) 2302 (1994). LBNL-34765
153. Interface segregation and clustering in strained-layer InGaAs/GaAs heterostructures studied by
cross-sectional scanning tunneling microscopy
J.F. Zheng, J.D. Walker, M.B. Salmeron and E.R. Weber.
Phys. Rev. Letts. 72, (15), 2414 (1994). LBNL-34768
Erratum: Phys. Rev. Letts. 73, (2) 368 (1994).
154. ‘Nano-catalysis’ by the tip of a scanning tunneling microscope operating inside a reactor cell
B.J. McIntyre, M. Salmeron and G.A. Somorjai.
Science. 265, 1415 (1994). LBNL-34787
155. Surface crystallography of a Re(0001)-(2×2)-S and Re (0001)-(2 3 ×2 3 )R30°-6S: A combined
LEED and STM study
A. Barbieri, D. Jentz, N. Materer, G. Held, J. Dunphy, D.F. Ogletree, P. Sautet, M. Salmeron, M.A.
Van Hove and G.A. Somorjai.
Surf. Sci. 312, 10 (1994). LBNL-34788
156. Si Donors (SiGa) in GaAs observed by scanning tunneling microscopy
J.F. Zheng, X. Liu, E.R. Weber, D.F. Ogletree and M.B. Salmeron.
J. Vac. Sci. Technol. B. 12, (3) 2104 (1994). LBNL-35006
157. Cross-sectional scanning tunneling microscopy of semiconductor vertical-cavity surface-emitting
laser structure
J.F. Zheng, D.F. Ogletree, J. Walker, M.B. Salmeron and E.R. Weber.
J. Vac. Sci. Technol. B. 12, (3) 2100 (1994). LBNL-35007
158. Empty state and filled state image of ZnGa acceptor in GaAs studied by STM
J.F. Zheng, M.B. Salmeron and E.R. Weber.
Appl. Phys. Lett. 64, (14), 1836 (1994). LBNL-35008
Erratum: Appl. Phys. Lett. 65, (6) 790 (1994).
159. Ultrafast scanning probe microscopy
D. Botkin, S. Weiss, D.F. Ogletree, M.B. Salmeron and D.S. Chemla.
Proc. Generation, Amplication and Measurement of Ultrashort Laser Pulses, Los Angeles,
California, January 25-27, 1994.
Generation, Amplication and Measurement of Ultrashort Laser Pulses, eds. R.P. Trebino and
I.A. Walmsley. Proc. SPIE 2116, 376 (1994). LBNL-35089
160. Toward ultrafast movies of moving atoms
S. Weiss, D. Botkin, D.F. Ogletree, M. Salmeron and D.S. Chemla.
Optics and Photonics News. December, 36 (1993).
161. Friction and load on well defined surfaces studied by atomic force microscopy
D.F. Ogletree, J. Hu, X.-d. Xiao, C. Morant, Q. Dai, R. Vollmer, R. Carpick and M. Salmeron.
Proc. Forces in Scanning Probe Methods, NATO Advanced Study Institute, Schluchsee, Germany,
March 7-18, 1994.
Forces in Scanning Probe Methods, eds. H.-J. Güntherodt, D. Anselmetti and E. Meyer, pp.
337-344. NATO ASI Series E : Applied Sciences. Kluwer Academic Publishers, The Netherlands,
1995. LBNL-35458
162. Atomic scale interface structure of In0.2Ga0.8As/GaAs strained layers studied by cross-sectional
scanning tunneling microscopy
J.F. Zheng, M.B. Salmeron and E.R. Weber.
Proc. 1993 Fall Meeting of the Materials Research Society, Boston, Massachusetts, November
29-December 2, 1993.
Defect-Interface Interactions Symposium, eds. E.P. Kvam, A.H. King, M.J. Mills, T.D. Sands
and V. Vitek, pp. 111-116. Mat. Res. Soc. Symp. Proc. Vol. 319. Materials Research Society,
Pittsburgh, 1994. LBNL-35470
163. An unexpected packing of fluorinated n-alkane thiols on Au(111): A combined atomic force
microscopy and x-ray dffraction study
G.-y. Liu, P. Fenter, C.E.D. Chidsey, D.F. Ogletree, P. Eisenberger and M. Salmeron.
J. Chem. Phys. 101, (5) 4301 (1994). LBNL-35527
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